Revistas
Artículos
Publicaciones
Documentos
REVISTA
IEEE TRANSACTIONS ON RELIABILITY
TODAS
Inicio
/
IEEE TRANSACTIONS ON RELIABILITY
/
Vol: 49 Núm: 3 Par: 0 (2000)
/
Artículo
ARTÍCULO
TITULO
SPECIAL SECTION -- FAULT-TOLERANT VLSI SYSTEMS - PAPERS - Fault-Tolerant VLSI Systems - Enhanced FPGA Reliability Through Efficient Run-Time Fault Reconfiguration
Lach
J
Mangione-Smith
W H
Potkonjak
M
Resumen
No disponible
PÁGINAS
pp. 296 - 304
NÚMERO
Volumen: 49 Número: 3 Parte: 0 (2000)
MATERIAS
INGENIERÍA Y CONSTRUCCIÓN CIVIL
REVISTAS SIMILARES
IEEE TRANSACTIONS ON INFORMATION THEORY
IEEE TRANSACTIONS ON RELIABILITY
Artículos similares
SPECIAL SECTION -- FAULT-TOLERANT VLSI SYSTEMS - PAPERS - Fault-Tolerant VLSI Systems - Software-Implemented EDAC Protection Against SEUs
Acceso
Shirvani, P P; Saxena, N; McCluskey, E J
Pág. 273 - 284
Revista:
IEEE TRANSACTIONS ON RELIABILITY
SPECIAL SECTION -- FAULT-TOLERANT VLSI SYSTEMS - PAPERS - Fault-Tolerant VLSI Systems - Common-Mode Failures in Redundant VLSI Systems: A Survey
Acceso
Mitra, S; Saxena, N R; McCluskey, E J
Pág. 285 - 295
Revista:
IEEE TRANSACTIONS ON RELIABILITY
SPECIAL SECTION -- FAULT-TOLERANT VLSI SYSTEMS - PAPERS - Fault-Tolerant VLSI Systems - Fault-Tolerant Evolvable Hardware Using Field-Programmable Transistor Arrays
Acceso
Keymeulen, D; Zebulum, R S; Jin, Y; Stoica, A
Pág. 305 - 316
Revista:
IEEE TRANSACTIONS ON RELIABILITY
SPECIAL SECTION -- FAULT-TOLERANT VLSI SYSTEMS - PAPERS - Commentary and Perspective - Commentary: Interconnection of Massive Numbers of Paths
Acceso
Plait, A O
Pág. 317 - 318
Revista:
IEEE TRANSACTIONS ON RELIABILITY
SPECIAL SECTION -- FAULT-TOLERANT VLSI SYSTEMS - PAPERS - Commentary and Perspective - Commentary -- Software: Metrics Mentality versus Statistical Mentality
Acceso
Healy, J D
Pág. 319 - 321
Revista:
IEEE TRANSACTIONS ON RELIABILITY
Revistas destacadas
Infrastructures
Informed Infraestructure
BiT
Revista de la Construcción
Ver todas las revistas