11   Artículos

 
en línea
Ivan Shtepliuk    
This paper presents a theoretical study on the effects of selected defects (oxygen vacancies and substitutional FeZn atoms) on the structural and electronic properties of a 2D ZnO/graphene heterostructure. Spin-polarized Hubbard- and dispersion-corrected... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Yang Liu, Bo Zhang, Yinian Feng, Xiaolin Lv, Dongfeng Ji, Zhongqian Niu, Yilin Yang, Xiangyang Zhao and Yong Fan    
Frequency multipliers and mixers based on Schottky barrier diodes (SBDs) are widely used in terahertz (THz) imaging applications. However, they still face obstacles, such as poor performance consistency caused by discrete flip-chip diodes, as well as low... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Runze Chen, Lixin Wang, Hongkai Zhang, Mengyao Cui and Min Guo    
The split gate resurf stepped oxide with highly doped epitaxial layer (HDSGRSO) UMOSFET has extremely low on-state resistance, therefore, it can be used in synchronous rectification circuits to replace rectifier diodes to reduce rectification losses. It ... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
He Guan and Shaoxi Wang    
Au-Pt-Ti/high-k/n-InAlAs metal-oxide-semiconductor (MOS) capacitors with HfO2-Al2O3 laminated dielectric were fabricated. We found that a Schottky emission leakage mechanism dominates the low bias conditions and Fowler?Nordheim tunneling became the main ... ver más
Revista: Coatings    Formato: Electrónico

 
en línea
Fengnan Li, Jingwen Zhang, Xiaoliang Wang, Minghui Zhang and Hongxing Wang    
Barrier heights of Au on hydrogen-/oxygen-/fluorine-/nitrogen-terminated diamond (H-/O-/F-/N-diamond) have been investigated by X-ray photoelectron spectroscopy. All of the H-/O-/F-/N-diamond surfaces have been formed on different areas of one diamond sa... ver más
Revista: Coatings    Formato: Electrónico

 
usuarios registrados
Suzuki, T; Yasui, T; Fujishima, H; Nozokido, T; Araki, M; Boric-Lubecke, O;     Pág. 1649 - 1655

 
usuarios registrados
Wu, Y; Armstrong, B M; Gamble, H S; Hu, Z; Chen, Q; Yang, S; Fusco, V F;     Pág. 641 - 646

 
usuarios registrados
Hesler, J L; Hall, W R; Crowe, T W; Weikle II, R M; Deaver Jr, B S; Bradley     Pág. 653 - 658

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