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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
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Vol: 49 Núm: 9 Par: 0 (2001)
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Artículo
ARTÍCULO
TITULO
MINI-SPECIAL ISSUE PAPERS - RF Circuit Performance Degradation Due to Soft Breakdown and Hot-Carrier Effect in Deep-Submicrometer CMOS Technology
Li
Q
Zhang
J
Li
W
Yuan
J S
Chen
Y
Oates
A S
Resumen
No disponible
PÁGINAS
pp. 1546 - 1551
NÚMERO
Volumen: 49 Número: 9 Parte: 0 (2001)
MATERIAS
INGENIERÍA Y CONSTRUCCIÓN CIVIL
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