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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
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Vol: 49 Núm: 8 Par: 0 (2001)
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Artículo
ARTÍCULO
TITULO
MINI-SPECIAL ISSUE PAPERS - Measurement Technique for Characterizing Memory Effects in RF Power Amplifiers
Vuolevi
J H K
Rahkonen
T
Manninen
J P A
Resumen
No disponible
PÁGINAS
pp. 1383 - 1389
NÚMERO
Volumen: 49 Número: 8 Parte: 0 (2001)
MATERIAS
INGENIERÍA Y CONSTRUCCIÓN CIVIL
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