Near-field microwave microscope with improved sensitivity and spatial resolution

Tselev

A. Anlage

S. M. Christen

H. M. Moreland

R. L. Talanov

V. V. Schwartz

A. R.

Resumen

No disponible

PÁGINAS

pp. 3167 - 3170

NÚMERO

Volumen: 74 Número: 6 Parte: 0 (2003)

MATERIAS

INGENIERÍA Y CONSTRUCCIÓN CIVIL

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