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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
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Vol: 51 Núm: 11 Par: 0 (2003)
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Artículo
ARTÍCULO
TITULO
Measurement of Electric-Field Intensities Using Scanning Near-Field Microwave Microscopy
Kantor
R. Shvets
I. V.
Resumen
No disponible
PÁGINAS
pp. 2228 - 2234
NÚMERO
Volumen: 51 Número: 11 Parte: 0 (2003)
MATERIAS
INGENIERÍA Y CONSTRUCCIÓN CIVIL
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