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KM Townsend, VN Giang, C Stephens, PT Scott, and DJ Trott
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Pág. 103 - 109
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TE Cornish, AL van Olphen, JL Cavender, JM Edwards, PT Jaeger, LL Vieyra, LF Woodard, DR Miller, and D O'Toole
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Pág. 110 - 117
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BM Crossley, SK Hietala, LM Shih, L Lee, EW Skowronski, and AA Ardans
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Pág. 124 - 132
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N Decaro, C Desario, M Campolo, G Elia, V Martella, D Ricci, E Lorusso, and C Buonavoglia
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Pág. 133 - 138
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T Shibahara, A Kuwano, T Ueno, Y Katayama, T Ohya, S Taharaguchi, S Yamamoto, T Umemura, Y Ishikawa, and K Kadota
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Pág. 145 - 150
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JB Rolland, D Bouchard, J Coll, and Winton, JR
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Pág. 151 - 157
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CS Hotz, SJ Templeton, and MM Christopher
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Pág. 158 - 164
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SB Kleiboeker, SK Schommer, SM Lee, S Watkins, W Chittick, and D Polson
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Pág. 165 - 170
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H Li, D O'Toole, O Kim, JL Oaks, and TB Crawford
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Pág. 171 - 175
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K Jung and C Chae
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Pág. 176 - 178
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F Gentilini, F Dondi, C Mastrorilli, M Giunti, C Calzolari, G Gandini, D Mancini, and PF Bergamini
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Pág. 179 - 183
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P Rehmann, A Grone, B Gottstein, J Vollm, H Sager, M Janovsky, and LN Bacciarini
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Pág. 183 - 186
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G Greco, A Madio, V Martella, M Campolo, M Corrente, D Buonavoglia, and C Buonavoglia
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Pág. 186 - 189
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SK Hietala, PJ Hullinger, BM Crossley, H Kinde, and AA Ardans
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Pág. 198 - 200
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A Wear, K Henderson, K Webster, and I Patel
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Pág. 99 - 102
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