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Francesco Aymerich and Massimiliano Pau
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Pág. 639 - 645
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Jung Ching Chung and Jen Fin Lin
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Pág. 646 - 654
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Z.-Q. Gong and K. Komvopoulos
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Pág. 655 - 663
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Fabrizio A. Stefani and Alessandro U. Rebora
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Pág. 664 - 671
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Jiaxin Zhao and Farshid Sadeghi
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Pág. 672 - 680
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Niranjan Ghaisas, Carl R. Wassgren, and Farshid Sadeghi
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Pág. 681 - 689
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Sy-Wei Lo, Bo-Qi Zhou, Ching-Feng Fang, and Yu-Sheng Lu
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Pág. 690 - 696
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Scott Bair
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Pág. 697 - 702
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T. Almqvist and R. Larsson
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Pág. 703 - 710
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Daejong Kim, Sanghoon Lee, Michael D. Bryant, and Frederick F. Ling
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Pág. 711 - 718
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Satoru Kaneko, Takemi Tanaka, Satoru Abe, and Takuya Ishikawa
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Pág. 719 - 727
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Scott Bair
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Pág. 728 - 732
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Malal Kane and Benyebka Bou-Said
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Pág. 733 - 737
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Yasuji Ohshima, Yasunaga Mitsuya, and Yusuke Iwase
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Pág. 738 - 744
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Xinjiang Shen, Mike Suk, and David B. Bogy
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Pág. 745 - 750
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Norio Tagawa, Tadao Tateyama, Atsunobu Mori, Nagayoshi Kobayashi, Yoshinobu Fujii, and Masako Ikegami
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Pág. 751 - 754
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Kenji Fukuzawa, Akira Nakada, Yasunaga Mitsuya, and Hedong Zhang
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Pág. 755 - 760
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Ning Yu and Andreas A. Polycarpou
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Pág. 761 - 766
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Yeau-Ren Jeng and Chung-Ming Tan
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Pág. 767 - 774
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K. Komvopoulos, V. Do, E. S. Yamaguchi, and P. R. Ryason
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Pág. 775 - 780
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David L. Rhode and Richard G. Adams
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Pág. 781 - 787
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A. D. McNickle and I. Etsion
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Pág. 788 - 794
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Frank C. Gift, Jr. , Wojciech Z. Misiolek, and Edwin Force II
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Pág. 795 - 801
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Wear-Rate Uncertainty Analysis
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Pág. 802 - 808
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Dana R. Swalla, Richard W. Neu, and David L. McDowell
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Pág. 809 - 816
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