REVISTA

REVIEW OF SCIENTIFIC INSTRUMENTS

ISSN: 0034-6748   Frecuencia: 12   Formato: Impresa

Tablas de contenido  

24 artículos asociados

Volumen 81 Número 8 Parte 0 Año 2010

Hamed Azarnoush, Sébastien Vergnole, Rafik Bourezak, Benoit Boulet, and Guy Lamouche
 

T. Gardiner, M. I. Mead, S. Garcelon, R. Robinson, N. Swann, G. M. Hansford, P. T. Woods, and R. L. Jones
 

G. Laity, A. Neuber, G. Rogers, and K. Frank
 

Seong Bong Kim, Dae Chul Kim, Won Namkung, Moohyun Cho, and Suk Jae Yoo
 

S. V. Dudin, D. V. Rafalskyi, and A. V. Zykov
 

Rohit Shukla, S. K. Sharma, P. Banerjee, R. Das, P. Deb, T. Prabahar, B. K. Das, B. Adhikary, and A. Shyam
 

Linyue Liu, Xiaoping Ouyang, Jizhen Zhao, Liang Chen, and Lan Wang
 

C. M. Cooper, W. Gekelman, P. Pribyl, and Z. Lucky
 

Dan M. Goebel and Ronald M. Watkins
 

S. Palazzo, A. Murari, G. Vagliasindi, P. Arena, D. Mazon, A. De Maack, and JET-EFDA Contributors
 

M. V. Roshan, S. V. Springham, R. S. Rawat, P. Lee, and M. Krishnan
 

Aleksander Labuda, William Paul, Brendan Pietrobon, R. Bruce Lennox, Peter H. Grütter, and Roland Bennewitz
 

Chuan-Yu Shao, Yusuke Kawai, Masayoshi Esashi, and Takahito Ono
 

J. Carroll, W. Abuzaid, J. Lambros, and H. Sehitoglu
 

T. Druga, M. Wenderoth, J. Homoth, M. A. Schneider, and R. G. Ulbrich
 

Mark P. Elenko, Jack W. Szostak, and Antoine M. van Oijen
 

Ashish Arora, Biswajit Karmakar, Sayantan Sharma, Michael Schardt, Stefan Malzer, Bhavtosh Bansal, Gottfried Döhler, and Brij M. Arora
 

Matthew Suggit, Giles Kimminau, James Hawreliak, Bruce Remington, Nigel Park, and Justin Wark
 

G. S. Jenkins, D. C. Schmadel, and H. D. Drew
 

Norio Okabayashi and Tadahiro Komeda
 

H. Okudaira, T. Uchimura, and T. Imasaka
 

Zak Frentz, Seppe Kuehn, Doeke Hekstra, and Stanislas Leibler
 

Yoshihisa Suzuki, Masayuki Tsukamoto, Haruhiko Sakuraba, Masamitsu Matsumoto, Makoto Nagasawa, and Katsuhiro Tamura
 

Johana Broke¿ová and Jirí Málek