REVISTA

IEEE TRANSACTIONS ON RELIABILITY

ISSN: 0018-9529 Frecuencia: 4 Formato: Impresa

Tablas de contenido

34 artículos asociados

Volumen 46 Número 1 Parte 0 Año 1997

EDITORIALS: Bayes: What it is -- What it is not	Solicitud
Evans, R A
Pág. 1 - 1

Prediction	Solicitud

Pág. 1 - 1

Manuscripts Received	Solicitud

Pág. 10 - 10

Comparison of robust and least-squares regression in computer-generated probability plots	Solicitud
Lawson, C; Keats, J; Montgomery, D
Pág. 108 - 115

A fault-tolerant protocol for election in chordal-ring networks with fail-stop processor failures	Solicitud
Pan, Y; Singh, C
Pág. 11 - 17

A general formula for the failure-rate function when distribution information is partially specified	Solicitud
Shore, H
Pág. 116 - 121

Accelerated life-tests for intermittent destructive inspection, with logistic failure-distribution	Solicitud
Sohn, S
Pág. 122 - 129

A termination rule for degradation experiments	Solicitud
Tseng, S; Yu, H
Pág. 130 - 133

Estimation of the geometric survival distribution	Solicitud
Lui, K
Pág. 134 - 140

Opinion Items	Solicitud

Pág. 141 - 141

Upper & lower bounds of stress-strength interference reliability with random strength-degradation	Solicitud
Xue, J; Yang, K
Pág. 142 - 145

Mixture model of the power law	Solicitud
Hirose, H
Pág. 146 - 153

Referee list	Solicitud

Pág. 154 - 158

Information for Readers & Authors	Solicitud

Pág. 159 - 159

Efficient optimization of all-terminal reliable networks, using an evolutionary approach	Solicitud
Dengiz, B; Altiparmak, F; Smith, A
Pág. 18 - 26

Comparison of electronics-reliability assessment approaches	Solicitud
Gottfried, P
Pág. 2 - 2

Statistical analysis of a power-law model for repair data	Solicitud
Park, W; Pickering, E
Pág. 27 - 29

Bounding flow-performance in probabilistic weighted networks	Solicitud
Strayer, H; Colbourn, C
Pág. 3 - 9

Free Proceedings	Solicitud

Pág. 30 - 30

Dynamic life-estimation of CMOS ICs in real operating environment: Precise electrical method and MLE	Solicitud
Son, K; Soma, M
Pág. 31 - 36

1997 Alan O. Plait Award	Solicitud

Pág. 37 - 37

A probabilistic characterization of adhesive-wear in metals	Solicitud
Qureshi, F; Sheikh, A
Pág. 38 - 43

Past Editors	Solicitud

Pág. 44 - 44

Electrochemical impedance spectroscopic study of encapsulated triple-tracks test (TTT) circuits	Solicitud
Kodnani, R; Madani, M; Granata, R
Pág. 45 - 51

Bayes computation for reliability estimation	Solicitud
Ahman, H; Huwang, L
Pág. 52 - 55

Bayes results for classical Pareto distribution via Gibbs sampler, with doubly-censored observations	Solicitud
Upadhyay, S; Shastri, V
Pág. 56 - 59

Software fault tolerance: T/(n-1)-variant programming	Solicitud
Xu, J; Randell, B
Pág. 60 - 67

Changes to: Sensitivity of reliability-growth models to operation profile errors vs testing accuracy	Solicitud

Pág. 68 - 68

Censored software-reliability models	Solicitud
Cai, K
Pág. 69 - 74

Invitation to Membership in the Reliability Society	Solicitud

Pág. 75 - 75

Bayes inference for s-shaped software-reliability growth models	Solicitud
Kuo, L; Lee, J; Choi, K; Yang, T
Pág. 76 - 80

Effect of parallel planning on system reliability of real-time expert systems	Solicitud
Chen, J
Pág. 81 - 87

Reliability modeling for safety-critical software	Solicitud
Schneidewind, N
Pág. 88 - 98

Time-censored ramp tests with stress bound for Weibull life-distribution	Solicitud
Bai, D; Chun, Y; Cha, M
Pág. 99 - 107