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Jaime Ramirez-Angulo, Alejandra Diaz-Armendariz, Jesus E. Molinar-Solis, Alejandro Diaz-Sanchez and Jesus Huerta-Chua
A comparative study of one-stage-amp performance improvement based on simulations in 22 nm, 45 nm, 90 nm, and 180 nm in deep submicrometer CMOS technologies is discussed. Generic SPICE models were used to simulate the circuits. It is shown that in all ca...
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