11   Artículos

 
en línea
Ruihang Zhang, Jiayan Yang, Mu Jia, Tingting Zhang and Yachuan Bao    
Wireless localization and target sensing both rely on precise extraction of parameters such as signal amplitude, propagation delay, and Doppler shift from the received signals. Due to the high multi-path resolution and strong penetration, both localizati... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Yanming Guo, Yan Bai, Shuaihe Gao, Zhibing Pan, Zibin Han, Decai Zou, Xiaochun Lu and Shougang Zhang    
An ultrahigh precise clock (space optical clock) will be installed onboard a low-orbit spacecraft (a usual expression for a low-orbit satellite operating on an orbit at an altitude of less than 1000 km) in the future, which will be expected to obtain bet... ver más
Revista: Information    Formato: Electrónico

 
en línea
Simone Cosoli    
The International Telecommunication Union (ITU) Resolution 612, in combination with Report ITU-R M2.234 (11/2011) and Recommendation ITU-R M.1874-1 (02/2013), regulates the use of the radiolocation services between 3 and 50 MHz to support high frequency ... ver más
Revista: Journal of Marine Science and Engineering    Formato: Electrónico

 
en línea
Weijin Qin, Yulong Ge, Pei Wei and Xuhai Yang    
To resolve the dilemma in any post-processing strategy, i.e., the difficulty of monitoring the real-time time and frequency signals in a timely manner, real-time GPS time and the frequency transfer have recently become trending topics. Unfortunately, dat... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Mingxuan Li, Ou Li, Guangyi Liu and Ce Zhang    
Recently, automatic modulation recognition has been an important research topic in wireless communication. Due to the application of deep learning, it is prospective of using convolution neural networks on raw in-phase and quadrature signals in developin... ver más
Revista: Applied Sciences    Formato: Electrónico

 
usuarios registrados
Jeske, Daniel R.; Chakravartty, Arunava     Pág. 530 - 538
Revista: TECHNOMETRICS    Formato: Impreso

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