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Jun-Young Park, Soo-Jong Park and Byeong-Kwon Ju
We analyzed the degradation features by measuring the capacitance?voltage characteristics after electrically aging blue thermally activated delayed fluorescence (TADF) organic light-emitting diodes (OLEDs). The measurement was investigated in terms of th...
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Catalin Palade, Adrian Slav, Ionel Stavarache, Valentin Adrian Maraloiu, Catalin Negrila and Magdalena Lidia Ciurea
The high-k-based MOS-like capacitors are a promising approach for the domain of non-volatile memory devices, which currently is limited by SiO2 technology and cannot face the rapid downsizing of the electronic device trend. In this paper, we prepare MOS-...
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Kouamé Boko Joël-Igor N?Djoré, Moussa Grafouté, Younes Makoudi, Waël Hourani and Christophe Rousselot
Tungsten oxide films are deposited onto glass and silicon substrates using reactive magnetron sputtering. Several studies have revealed difficulties in studying the electrical properties of resistive WOx films. The main objective of this work is to propo...
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Atabek E. Atamuratov, Ahmed Yusupov, Zukhra A. Atamuratova, Jean Chamberlain Chedjou and Kyandoghere Kyamakya
The results obtained in this work could serve many purposes such as the various reliability issues related to MOSFETs degradation under electrical stress.
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Jihua Zhang, Huizhong Zeng, Min Zhang, Wei Liu, Zuofan Zhou, Hongwei Chen, Chuanren Yang, Wanli Zhang, and Yanrong Li
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