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Vincenzo Vinciguerra, Giuseppe Luigi Malgioglio, Antonio Landi and Marco Renna
The successful handling of large semiconductor wafers is crucial for scaling up their production. Early-stage warpage control allows the prevention of undesirable asymmetric warpage, known as wafer bifurcation or buckling. Indeed, even in a gravity-free ...
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Hasan Abu-Rasheed, Christian Weber, Johannes Zenkert, Mareike Dornhöfer and Madjid Fathi
In modern industrial systems, collected textual data accumulates over time, offering an important source of information for enhancing present and future industrial practices. Although many AI-based solutions have been developed in the literature for a do...
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Arif Can Gungor, Marzena Olszewska-Placha, Malgorzata Celuch, Jasmin Smajic and Juerg Leuthold
Non-destructive dielectric and semiconductor material characterization using dielectric resonator.
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