2   Artículos

 
en línea
Gee-Soo Lee and Chan-Jung Kim    
Microcracks of depth less than 200 µm in mechanical components are difficult to detect because conventional methods such as X-ray or eddy current measurements are less sensitive to such depths. Nonetheless, an efficient microcrack detection method is req... ver más
Revista: Applied Sciences    Formato: Electrónico

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