2   Artículos

A Physical Model-Based Approach to Detecting Sky in Photographic Images

Revista: IEEE TRANSACTIONS ON IMAGE PROCESSING    Formato: Impreso

Tabla de contenido: Vol: 11 Num: 3 Par: 0 Año: 2002

Statistical Pattern Analysis Normalized Kemeny and Snell Distance: A Novel Metric for Quantitative Evaluation of Rank-Order Similarity of Images

Revista: IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE    Formato: Impreso

Tabla de contenido: Vol: 24 Num: 8 Par: 0 Año: 2002