3 Artículos

Space-resolved extreme ultraviolet spectrometer for impurity emission profile measurement in Large Helical Device

Solicitud

usuarios registrados

Chunfeng Dong, Shigeru Morita, Motoshi Goto, and Hangyu Zhou

Revista: REVIEW OF SCIENTIFIC INSTRUMENTS Formato: Impreso

Tabla de contenido: Vol: 81 Num: 3 Par: 0 Año: 2010

Spectroscopic evaluation of three different gratings used for a flat-field extreme ultraviolet spectrometer to monitor n=1 transitions from medium-Z impurities in 10¿30 Å

Solicitud

usuarios registrados

Malay Bikas Chowdhuri, Shigeru Morita, Motoshi Goto, and Hiroyuki Sasai

Revista: REVIEW OF SCIENTIFIC INSTRUMENTS Formato: Impreso

Tabla de contenido: Vol: 79 Num: 10 Par: 0 Año: 2008

Fast ion charge exchange spectroscopy measurement using a radially injected neutral beam on the large helical device

Solicitud

usuarios registrados

Masaki Osakabe, Sadayoshi Murakami, Mikirou Yoshinuma, Katsumi Ida, Allan Whiteford, Motoshi Goto, Daiji Kato, Takako Kato, Kenichi Nagaoka, Tokihiko Tokuzawa, Yasuhiko Takeiri, and Osamu Kaneko

Revista: REVIEW OF SCIENTIFIC INSTRUMENTS Formato: Impreso

Tabla de contenido: Vol: 79 Num: 10 Par: 0 Año: 2008

« Anterior Página: 1 de 1 Siguiente »