2   Artículos

 
en línea
Jaime Ramirez-Angulo, Alejandra Diaz-Armendariz, Jesus E. Molinar-Solis, Alejandro Diaz-Sanchez and Jesus Huerta-Chua    
A comparative study of one-stage-amp performance improvement based on simulations in 22 nm, 45 nm, 90 nm, and 180 nm in deep submicrometer CMOS technologies is discussed. Generic SPICE models were used to simulate the circuits. It is shown that in all ca... ver más
Revista: Journal of Low Power Electronics and Applications    Formato: Electrónico

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