2   Artículos

Rapid and mass growth of stress-induced nanowhiskers on the surfaces of evaporated polycrystalline Cu films

Revista: SCRIPTA MATERIALIA    Formato: Impreso

Tabla de contenido: Vol: 56 Num: 12 Par: 0 Año: 2007

Microscopic four-point atomic force microscope probe technique for local electrical conductivity measurement

Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

Tabla de contenido: Vol: 76 Num: 8 Par: 0 Año: 2005