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Michela Borghesi, Cristian Zambelli, Rino Micheloni and Stefano Bonnini
Solid-state drives represent the preferred backbone storage solution thanks to their low latency and high throughput capabilities compared to mechanical hard disk drives. The performance of a drive is intertwined with the reliability of the memories; hen...
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Jaeho Kim and Jung Kyu Park
The demand for mass storage devices has become an inevitable consequence of the explosive increase in data volume. The three-dimensional (3D) vertical NAND (V-NAND) and quad-level cell (QLC) technologies rapidly accelerate the capacity increase of flash ...
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Alessandro S. Spinelli, Christian Monzio Compagnoni and Andrea L. Lacaita
We review the state-of-the-art in the understanding of planar NAND Flash memory reliability and discuss how the recent move to three-dimensional (3D) devices has affected this field. Particular emphasis is placed on mechanisms developing along the lifeti...
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Rino Micheloni, Luca Crippa, Cristian Zambelli and Piero Olivo
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