4 Artículos

The Research on the Signal Generation Method and Digital Pre-Processing Based on Time-Interleaved Digital-to-Analog Converter for Analog-to-Digital Converter Testing

Acceso

en línea

Li Wang, Wenli Chen, Kai Chen, Renjun He and Wenjian Zhou

In the high-resolution analog circuit, the performance of chips is an important part. The performance of the chips needs to be determined by testing. According to the test requirements, stimulus signal with better quality and performance is necessary. Th... ver más

Revista: Applied Sciences Formato: Electrónico

Tabla de contenido: Vol: 12 Num: 0 Par: 3 Año: 2022

A Novel Fault Diagnosis Method for Analog Circuits Based on Multi-Input Deep Residual Networks with an Improved Empirical Wavelet Transform

Acceso

en línea

Zhen Liu, Xuemei Liu, Songlin Xie, Junhai Wang and Xiuyun Zhou

Analog circuits play an essential role in electronic systems. To strengthen the reliability of sophisticated electronic circuits, this paper proposes a novel analog circuit fault diagnosis method. Compared with traditional fault diagnosis, the fault diag... ver más

Revista: Applied Sciences Formato: Electrónico

Tabla de contenido: Vol: 12 Num: 0 Par: 3 Año: 2022

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