|
|
|
Thiago Poleto, Thyago Celso Cavalcante Nepomuceno, Victor Diogho Heuer de Carvalho, Ligiane Cristina Braga de Oliveira Friaes, Rodrigo Cleiton Paiva de Oliveira and Ciro José Jardim Figueiredo
This paper aims to analyze the intellectual structure and research fronts in application information security in smart cities to identify research boundaries, trends, and new opportunities in the area. It applies bibliometric analyses to identify the mai...
ver más
|
|
|
|
|
|
|
Haiping Zhang, Jessica J. Pilgram, Carmen G. Constantin, Lucas Rovige, Peter V. Heuer, Sofiya Ghazaryan, Marietta Kaloyan, Robert S. Dorst, Derek B. Schaeffer and Christoph Niemann
We present two-dimensional (2D) optical Thomson scattering measurements of electron density and temperature in laser-produced plasmas. The novel instrument directly measures ne(x,y)" role="presentation">????(??,??)ne(x,y)
n
e
(
x
,
y
)
and Te(x,y)" role...
ver más
|
|
|
|
|
|
|
Thiago Poleto, Thyago Celso Cavalcante Nepomuceno, Victor Diogho Heuer de Carvalho and Ana Paula Cabral Seixas Costa
This paper proposes a strategic behavior categorization between the contractor and the provider in information technology (IT) outsourcing. We identified four behaviors (or attitudes) focusing specifically on the contractors? attitudes: (a) conservative,...
ver más
|
|
|
|
|
|
|
Jens Smiatek, Andreas Heuer and Martin Winter
|
|
|
|
|
|
|
Iryna Patsora, Henning Heuer, Susanne Hillmann and Dmytro Tatarchuk
Particle-based films are today an important part of various designs and they are implemented in structures as conductive parts, i.e., conductive paste printing in the manufacture of Li-ion batteries, solar cells or resistive paste printing in IC. Recentl...
ver más
|
|
|
|
|
|
|
Anou Dreyfus, Jackie Benschop, Julie Collins-Emerson, Peter Wilson, Michael G. Baker and Cord Heuer
|
|
|
|
|
|
|
Gabriel N. Gatica; Norbert Heuer; Francisco-Javier Sayas
Pág. 1369 - 1394
|
|
|
|
|
|
|
Heinz-Josef Koch, Henning Heuer, Olga Tomanová, Bernward Märländer
Pág. 69 - 77
|
|
|
|
|
|
|
A.H. Heuer, F. Ernst, H. Kahn, A. Avishai, G.M. Michal, D.J. Pitchure and R.E. R
Pág. 1067 - 1070
|
|
|
|
|
|
|
M. Zhang and A.H. Heuer
Pág. 1265 - 1269
|
|
|
|