5   Artículos

 
en línea
Jong-Chih Chien, Ming-Tao Wu and Jiann-Der Lee    
To detect and classify semiconductor wafer defects in order to help determine the cause(s) of the defects.
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Hsin-Pei Hsueh, Chien-Ming Wang, Cheng-Feng Wu and Fangjhy Li    
In this study, using the medical expenditures of the Taiwanese government and gross domestic product (GDP) as variables, the wavelet analysis method was used to empirically study the correlations and lead-lag relationships in quarterly data in the period... ver más

 
usuarios registrados
Chien-ming Wu    
Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

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