2   Artículos

 
en línea
Mohammad Sadeghi, Amir Zelati, Sahar Rezaee, Carlos Luna, Robert Saraiva Matos, Marcelo Amanajás Pires, Nilson S. Ferreira, Henrique Duarte da Fonseca Filho, Azin Ahmadpourian and Stefan Talu    
In the present work, Cu/Cr thin films were deposited on substrates of a different nature (Si, Glass, Bk7, and ITO) through a thermal evaporation deposition method. Non-contact atomic force microscopy (AFM) was used to obtain 3D AFM topographical maps of ... ver más
Revista: Coatings    Formato: Electrónico

 
en línea
Dmitriy Ivonin, Timofey Kalnin, Eugene Grachev and Evgeny Shein    
We present a methodology for a numerical analysis of three-dimensional tomographic images in this paper. The methodology is based on integral geometry, topology, and morphological analysis methods. It involves calculating cumulative and non-cumulative po... ver más
Revista: Geosciences    Formato: Electrónico

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