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Sören Möller, Daniel Höschen, Sina Kurth, Gerwin Esser, Albert Hiller, Christian Scholtysik, Christian Dellen and Christian Linsmeier
The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray ...
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