13   Artículos

 
en línea
Dipayan Mazumder, Mithun Datta, Alexander C. Bodoh and Ashiq A. Sakib    
The increasing demand for high-speed, energy-efficient, and miniaturized electronics has led to significant challenges and compromises in the domain of conventional clock-based digital designs, most notably reduced circuit reliability, particularly in mi... ver más
Revista: Journal of Low Power Electronics and Applications    Formato: Electrónico

 
en línea
Ján Mach, Luká? Kohútka and Pavel Cicák    
The shrinking of technology nodes allows higher performance, but susceptibility to soft errors increases. The protection has been implemented mainly by lockstep or hardened process techniques, which results in a lower frequency, a larger area, and higher... ver más
Revista: Journal of Low Power Electronics and Applications    Formato: Electrónico

 
en línea
Eunchae Kang, Amir Tjolleng, Hayeon Yu, Kihyo Jung and Joonho Chang    
This research aims to examine touch performance and user-satisfaction depending on key location in a QWERTY soft keyboard during two-thumb key entry on a smartphone. Thirty-three college students who were smartphone users were recruited, and an experimen... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Zhao Xue, Jun Fu, Qiankun Fu, Xiaokang Li and Zhi Chen    
Green forage maize harvesters face challenges such as high soil humidity and soft soil in the field, mismatched working parameters, and poor reliability and adaptability. These challenges often result in header blockage, significant harvest loss, and inc... ver más
Revista: Agriculture    Formato: Electrónico

 
en línea
Hui Luo, Lianming Cai and Chenbiao Li    
As the operational time of the railway increases, rail surfaces undergo irreversible defects. Once the defects occur, it is easy for them to develop rapidly, which seriously threatens the safe operation of trains. Therefore, the accurate and rapid detect... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Raffaele Giordano, Dario Barbieri, Sabrina Perrella and Roberto Catalano    
The usage of SRAM-based Field Programmable Gate Arrays on High Energy Physics detectors is mostly limited by the sensitivity of these devices to radiation-induced upsets in their configuration. These effects may alter the functionality until the next rec... ver más
Revista: Instruments    Formato: Electrónico

 
en línea
Vanessa Vargas, Pablo Ramos, Jean-Francois Méhaut and Raoul Velazco    
Multi-core and many-core processors are a promising solution to achieve high performance by maintaining a lower power consumption. However, the degree of miniaturization makes them more sensitive to soft-errors. To improve the system reliability, this wo... ver más
Revista: Applied Sciences    Formato: Electrónico

 
usuarios registrados
Thaller, K. Steininger, A.     Pág. 413 - 422
Revista: IEEE TRANSACTIONS ON RELIABILITY    Formato: Impreso

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