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Tie-Gang Wang, Yu Dong, Yanmei Liu, Srinivasan Iyengar, Kwang Ho Kim and Zubing Yang
In this work, the surface morphology changes of nanocrystalline Cr2O3 film deposited on Si wafer during the heating process were observed in-situ by means of an environmental scanning electron microscope (ESEM). The Cr2O3 film cracked at high temperature...
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