3   Artículos

Vibrations of the "beetle" scanning probe microscope: Identification of a new mode, generalized analysis, and characterization methodology

Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

Tabla de contenido: Vol: 77 Num: 3 Par: 0 Año: 2006

Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization

Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

Tabla de contenido: Vol: 77 Num: 5 Par: 0 Año: 2006

Cantilever tilt compensation for variable-load atomic force microscopy

Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

Tabla de contenido: Vol: 76 Num: 5 Par: 0 Año: 2005