11   Artículos

 
en línea
Samra Saleem, Ammara Maryam, Kaneez Fatima, Hadia Noor, Fatima Javed and Muhammad Asghar    
To realize practical applications of nanowire-based devices, it is critical, yet challenging, to control crystal structure growth of III-V semiconductor nanowires. Here, we demonstrate that controlled wurtzite and zincblende phases of InAs nanowires can ... ver más
Revista: Coatings    Formato: Electrónico

 
en línea
Minghui Gu, Chen Li, Yuanfeng Ding, Kedong Zhang, Shunji Xia, Yusheng Wang, Ming-Hui Lu, Hong Lu and Yan-Feng Chen    
Two-dimensional (2D) featured antimonene has been directly grown on sapphire substrates by molecular beam epitaxy. The van der Waals epitaxy growth can be promoted through temperature control in the growth window. The competing mechanism between 2D and t... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Stuart Reid and Iain W. Martin    
The first detections of gravitational waves, GW150914 and GW151226, were associated with the coalescence of stellar mass black holes, heralding the opening of an entirely new way to observe the Universe. Many decades of development were invested to achie... ver más
Revista: Coatings    Formato: Electrónico

 
usuarios registrados
J. A. Dura and J. LaRock    
Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

 
usuarios registrados
Frank Tsui and Liang He     Pág. -
Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

 
usuarios registrados
M. Ohtani, M. Lippmaa, T. Ohnishi, and M. Kawasaki     Pág. -
Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

 
usuarios registrados
P. Kury, R. Hild, D. Thien, H.-L. Günter, F.-J. Meyer zu Heringdorf, and M. Horn-von Hoegen     Pág. -
Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

 
usuarios registrados
Jenichen, B. Braun, W. Kaganer, V. M. Shtukenberg, A. G. Daweritz, L. Schulz, C.-G. Ploog, K. H. Erko, A.     Pág. 1267 - 1273
Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

 
usuarios registrados
Tiedje, H. F.; Brodie, D. E.     Pág. 2121 - 2124
Revista: REVIEW OF SCIENTIFIC INSTRUMENTS    Formato: Impreso

 
usuarios registrados
Rao, R V V V J; Chong, T C; Tan, L S; Lau, W S     Pág. 147 - 152
Revista: IEEE TRANSACTIONS ON RELIABILITY    Formato: Impreso

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