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Jiamu Li, Ji Zhang, Mohamed Jaward Bah, Jian Wang, Youwen Zhu, Gaoming Yang, Lingling Li and Kexin Zhang
When dealing with high-dimensional data, such as in biometric, e-commerce, or industrial applications, it is extremely hard to capture the abnormalities in full space due to the curse of dimensionality. Furthermore, it is becoming increasingly complicate...
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