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H.-J. Bau, Y.-J. Kung, J. A. J. Raja, S.-J. Chan, K.-C. Chen, Y.-K. Chen, H.-W. Wu, and S.-D. Yeh
Pág. 848 - 856
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C.-Y. Yu, C. Chu, S.-J. Chou, M.-R. Chao, C.-M. Yeh, D.-Y. Lo, Y.-C. Su, Y.-M. Horng, B.-C. Weng, J.-G. Tsay, and K.-C. Huang
Pág. 1544 - 1549
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Yeh, L.-C.; Lee, W.-M.; Koh, B.-W.; Chan, J.P.; Liu, C.-H.; Kao, J.-P.; Chou, C.-C.
Pág. 577 - 587
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Jinn-Yi Yeh and J.
Pág. 706 - 715
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John J. Weiland, David Van Winkle, Michael C. Edwards, Rebecca L. Larson, Weilin L. Shelver, Thomas P. Freeman, and Hsing-Yeh Liu
Pág. 1245 - 1254
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Maureen M.M. Fitch, Paul H. Moore, Terryl C.W. Leong, Leslie Ann Y. Akashi, Aileen K.F. Yeh, Susan A. White, Amy S. Dela Cruz, Lance T. Santo, Stephen A. Ferreira, and Leslie J. Poland
Pág. 1283 - 1290
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Maureen M.M. Fitch, Paul H. Moore, Terryl C.W. Leong, Leslie Ann Y. Akashi, Aileen K.F. Yeh, Susan A. White, Amy S. Dela Cruz, Lance T. Santo, Stephen A. Ferreira, and Leslie J. Poland
Pág. 1291 - 1297
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Bau, H.-J. Cheng, Y.-H. Yu, T.-A. Yang, J.-S. Yeh, S.-D.
Pág. 112 - 132
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Lin, I.-C. Yeh, J.-S. Ouhyoung, M.
Pág. 72 - 81
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Chen, H.-H. Yeh, J.-F. Suehiro, N.
Pág. 126 - 135
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