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Fanchang Meng, Zili Zhang, Yanhui Kang, Chengjun Cui, Dezhao Wang, Xinxin Zhang and Weihu Zhou
With the advent of the era of big data and the vigorous development of consumer electronics, the demand for higher-speed processing capacity for gigantic amounts of data is increasing; this requires finer and far more numerous connections between dies as...
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Jong-Chih Chien, Ming-Tao Wu and Jiann-Der Lee
To detect and classify semiconductor wafer defects in order to help determine the cause(s) of the defects.
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Ting Dong and Nam H. Kim
Although structural health monitoring (SHM) technologies using sensors have dramatically been developed recently, their capability should be evaluated from the perspective of the maintenance industry. As a first step toward utilizing sensors, the objecti...
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