3   Artículos

 
en línea
Vincenzo Vinciguerra, Giuseppe Luigi Malgioglio, Antonio Landi and Marco Renna    
The successful handling of large semiconductor wafers is crucial for scaling up their production. Early-stage warpage control allows the prevention of undesirable asymmetric warpage, known as wafer bifurcation or buckling. Indeed, even in a gravity-free ... ver más
Revista: Applied Sciences    Formato: Electrónico

 
en línea
Marco Renna, Ji Hyun Nam, Mauro Buttafava, Federica Villa, Andreas Velten and Alberto Tosi    
In this paper we present a novel single-photon detector specifically designed for Non-Line-Of-Sight (NLOS) imaging applications within the framework of the DARPA REVEAL program. The instrument is based on a linear 16 × 1 Complementary Metal-Oxide-Semicon... ver más
Revista: Instruments    Formato: Electrónico

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