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J. Zhang, Y. Cheng, Y. Z. Lee, B. Gao, Q. Qiu, W. L. Lin, D. Lalush, J. P. Lu, and O. Zhou
Pág. -
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Xu, J. Hu, Q. Lee, W.-C. Lee, D. L.
Pág. 125 - 139
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Wang, Q. Horton, R. Lee, J.
Pág. 436 - 443
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Truong, T-K; Jeng, J-H; Reed, I S; Lee, P C; Li, A Q
Pág. 529 - 535
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Baeyens Y. Dorschky C. Weimann N. Lee Q. Kopf R. Georgiou G. Mattia J.-P. Hamm R. Chen Y.-K.
Pág. 2403 - 2408
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Lee, M-Q; Yi, S-J; Nam, S; Kwon, Y; Yeom, K-W
Pág. 1670 - 1679
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Agarwal, B; Lee, Q; Mensa, D; Pullela, R; Guthrie, J; Rodwell, M J W
Pág. 2302 - 2307
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