Inicio  /  ISIJ INTERNATIONAL  /  Vol: 40 Núm: 8 Par: 0 (2000)  /  Artículo
ARTÍCULO
TITULO

Determination of Trace Impurities in Graphite and Silicon Carbide by Total Reflection X-ray Fluorescence Spectrometry after Homogeneous Liquid¿Liquid Extraction

Hitoshi Yamaguchi    
Shinji Itoh    
Shukuro Igarashi    
Kunishige Naitoh and Ryosuke Hasegawa    

Resumen

No disponible

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