ARTÍCULO
TITULO

Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis

W. Ludwig    
P. Reischig    
A. King    
M. Herbig    
E. M. Lauridsen    
G. Johnson    
T. J. Marrow    
and J. Y. Buffière    

Resumen

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