Inicio  /  INSIGHT  /  Vol: 51 Núm: 1 Par: 0 (2009)  /  Artículo
ARTÍCULO
TITULO

Sensitive inspection of void defects using synchrotron refraction imaging with quantitative modelling of contrast enhancement

K Imamura    
Y Inada    
N Ehara    
K Umetani and Y Nakajima    

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