SPECIAL ISSUE ON SILICON-BASED RF AND MICROWAVE INTEGRATED CIRCUITS - PAPERS - A Study of Parasitic Effects of ESD Protection on RF ICs

Gong

Feng

Zhan

Wang

A Z H

Resumen

No disponible

PÁGINAS

pp. 393 - 402

NÚMERO

Volumen: 50 Número: 1(2) Parte: 0 (2002)

MATERIAS

INGENIERÍA Y CONSTRUCCIÓN CIVIL

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