Broad-Band Microwave Characterization of Bilayered Materials Using a Coaxial Discontinuity with Applications for Thin Conductive Films for Microelectronics and Material in Air-Tight Cell

Belhadj-Tahar

N-e

Meyer

Fourrier-Lamer

Resumen

No disponible

PÁGINAS

pp. 260 - 267

NÚMERO

Volumen: 45 Número: 2 Parte: 0 (1997)

MATERIAS

INGENIERÍA Y CONSTRUCCIÓN CIVIL

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