ARTÍCULO
TITULO

Four point bending setup for characterization of semiconductor piezoresistance

J. Richter    
M. B. Arnoldus    
O. Hansen    
and E. V. Thomsen    

Resumen

No disponible

 Artículos similares

       
 
Mfowabo Maphosa, Wesley Doorsamy and Babu Paul    
The role of academic advising has been conducted by faculty-student advisors, who often have many students to advise quickly, making the process ineffective. The selection of the incorrect qualification increases the risk of dropping out, changing qualif... ver más
Revista: Algorithms

 
Wensi Li, Yu Zhang, Ruizhi Li, Lijun Zhang, Xingwang Zhang, Hongyin Li, Peng Nie and Shengdong Zhang    
Currently, over 100 nuclear power units globally have been in operation for more than 40 years. Hindered by the limitations of computer technology at the time, these nuclear facilities lack detailed electronic drawings. Activities such as equipment repla... ver más
Revista: Applied Sciences

 
Jiahao Chen, Jiaxin Li, Deqian Zheng, Qianru Zheng, Jiayi Zhang, Meimei Wu and Chaosai Liu    
The multi-field coupling of grain piles in grain silos is a focal point of research in the field of grain storage. The porosity of grain piles is a critical parameter that affects the heat and moisture transfer in grain piles. To investigate the distribu... ver más
Revista: Applied Sciences

 
Enrique Ortega-Toro, Ricardo André Birrento-Aguiar, José María Giménez-Egido, Francisco Alarcón-López and Gema Torres-Luque    
The aim of this study was to analyse the performance of technical?tactical actions in two different types of tournaments and the influence of biological age on the performance of young basketball players. Thirty-seven under-13 male basketball players (ag... ver más
Revista: Applied Sciences

 
P. C. Iglesias, L. Godinho and J. Redondo    
Extracting the microscopic parameters of a porous material is a complex task, and attempts have been made to develop models that can simulate their characteristics, gathering the least amount of information possible. As a case in point, tests to evaluate... ver más
Revista: Applied Sciences