Resumen
This article presents a defect detection model of sugarcane plantation images. The objective is to assess the defect areas occurring in the sugarcane plantation before the harvesting seasons. The defect areas in the sugarcane are usually caused by storms and weeds. This defect detection algorithm uses high-resolution sugarcane plantations and image processing techniques. The algorithm for defect detection consists of four processes: (1) data collection, (2) image preprocessing, (3) defect detection model creation, and (4) application program creation. For feature extraction, the researchers used image segmentation and convolution filtering by 13 masks together with mean and standard deviation. The feature extraction methods generated 26 features. The K-nearest neighbors algorithm was selected to develop a model for the classification of the sugarcane areas. The color selection method was also chosen to detect defect areas. The results show that the model can recognize and classify the characteristics of the objects in sugarcane plantation images with an accuracy of 96.75%. After the comparison with the expert surveyor?s assessment, the accurate relevance obtained was 92.95%. Therefore, the proposed model can be used as a tool to calculate the percentage of defect areas and solve the problem of evaluating errors of yields in the future.