Inicio  /  Applied Sciences  /  Vol: 10 Par: 22 (2020)  /  Artículo
ARTÍCULO
TITULO

Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers

Olivier Douhéret    
Didier Théron and David Moerman    

Resumen

High resolution electrical characterization of organic semiconducting materials and structures?Microwave probing techniques for the description of mesoscopic mechanisms governing charge transport in organic semiconductors.

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