On-the-Fly Machine Learning for Improving Image Resolution in Tomography

Allard A. Hendriksen

Daniël M. Pelt

Willem Jan Palenstijn

Sophia B. Coban and Kees Joost Batenburg

Resumen

Computationally improving the resolution of laboratory X-ray CT scanners.

Palabras claves

computed tomography - super-resolution - region-of-interest tomography - machine learning - deep learning

Acceso

PÁGINAS

pp. 0 - 0

NÚMERO

Volumen: 9 Parte: 12 (2019)

MATERIAS

REVISTAS SIMILARES

DOI

https://doi.org/10.3390/app9122445

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