Resumen
Surface roughness is widely used in the research of topography, and the scaling characteristics of roughness have been noticed in many fields. To rapidly obtain the relationship between root-mean-squared roughness (Rq" role="presentation">????Rq
R
q
) and measurement scale (L) could be helpful to achieve more understandings of the surface property, particularly the Rq" role="presentation">????Rq
R
q
-L curve could be fitted to calculate the fractal dimension (D). In this study, the robustness of Rq" role="presentation">????Rq
R
q
against low number of picture elements was investigated. Artificial surfaces and the surfaces of two actual samples (a silver thin film and a milled workpiece) were selected. When the number of picture elements was lowered, Rq" role="presentation">????Rq
R
q
was found to be stable within a large portion of the concerned scope. Such a robustness property could validate the feasibility of Rq" role="presentation">????Rq
R
q
-L curve obtained by segmenting a single morphological picture with roughness scaling extraction (RSE) method, which was proposed in our previous study. Since the traditional roughness (TR) method to obtain Rq" role="presentation">????Rq
R
q
-L curves was based on multiple pictures, which used a fixed number of picture elements at various L, RSE method could be significantly more rapid than TR method. Moreover, a direct comparison was carried out between RSE method and TR method in calculating the Rq" role="presentation">????Rq
R
q
-L curve and D, and the credibility and accuracy of RSE method with flatten order 1 and 2 was verified.