Redirigiendo al acceso original de articulo en 17 segundos...
Inicio  /  Coatings  /  Vol: 7 Núm: 6 Par: June (2017)  /  Artículo
ARTÍCULO
TITULO

Nitrogen Trapping Ability of Hydrogen-Induced Vacancy and the Effect on the Formation of AlN in Aluminum

Duy Dat Vo    
Aleksey G. Lipnitskii    
Truong Khang Nguyen and Thoi Trung Nguyen    

Resumen

This paper presents the ternary interaction of N, H, and vacancy point defects and the nitrogen trapping ability of aluminum vacancies induced by hydrogen by means of DFT methods employed in VASP (Vienna Ab initio Simulation Package) and Abinit packages. The obtained vacancy formation energy of 0.65 eV is close to experimental values. Although the N?vacancy complex is unstable with the negative binding energy of -0.51 eV, the stability of H?vacancy?N is proved by the positive binding energy of 0.59 eV and the appearance of the orbital hybridization in the density of state (DOS) of atoms connecting to this complex. Moreover, Al vacancies can trap more than 4 N atoms, which prevents the formation of aluminum nitride and subsequently affects not only the hardness of the Al surface but also many practical applications of AlN coating.

 Artículos similares

       
 
Linlin Sun, Liu Chu, Jiajia Shi and Eduardo Souza de Cursi    
The unavoidable vacancy defects dispersed throughout the entire pristine graphene tailor to the integrity of the lattice structure and thereby have complicated impacts on the mechanical and thermal properties of graphene. In order to analyze the influenc... ver más
Revista: Applied Sciences

 
Xiaoming Huang, Dong Zhou and Weizong Xu    
The electrical characteristics of amorphous InGaZnO (a-IGZO) thin film transistors (TFTs) deposited with different N2/O2 partial pressure ratios (PN/O) are investigated. It is found that the device with 20% PN/O exhibits enhanced electrical stability aft... ver más
Revista: Applied Sciences