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Inicio  /  Applied Sciences  /  Vol: 10 Par: 23 (2020)  /  Artículo
ARTÍCULO
TITULO

Advanced Modelling Techniques for Resonator Based Dielectric and Semiconductor Materials Characterization

Arif Can Gungor    
Marzena Olszewska-Placha    
Malgorzata Celuch    
Jasmin Smajic and Juerg Leuthold    

Resumen

Non-destructive dielectric and semiconductor material characterization using dielectric resonator.

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