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Inicio  /  Applied Sciences  /  Vol: 9 Par: 11 (2019)  /  Artículo
ARTÍCULO
TITULO

Algorithm for Surfaces Profiles and Thickness Variation Measurement of a Transparent Plate Using a Fizeau Interferometer with Wavelength Tuning

Tao Sun    
Weiwei Zheng    
Yingjie Yu    
Ketao Yan    
Anand Asundi and Sergiy Valukh    

Resumen

The proposed method is used to separate the overlapped interferograms formed by parallel interfaces, specifically, surfaces of a transparent plate, and to obtain the front and rear surface profiles, as well as the thickness, simultaneously.